아래와 같이 세미나를 개최하오니 많이 참석해 주시기 바랍니다. 아 래 제목:X-ray absorption fine structure analyses on amorphous oxide films 연사: 조 덕 용 연구교수(성균관대학교 물리학과) 일시: 2009년 4월 14일(화) 오후 3시 장소: 물리학과세미나실 (31355호실) 초록: The local structures of various amorphous oxide films were studied using the x-ray absorption fine structure (XAFS) analysis technique. The structural evolution in the amorphized oxide films (compared with crystalline films) can be interpreted as the weakened structural correlation. Path-by-path analyses enabled us to understand further the detailed atomic redistributions in the amorphous films. This presentation will exemplify a few implementations of the methodology to reveal the atomic-scale origin of macroscopic quantities such as the dielectric response or electrical conduction in the amorphous media.